| Card | Table | RUSMARC | |
|
|
Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov. — 1 online resource (249 p.) — <URL:http://elib.fa.ru/ebsco/2329686.pdf>.Record create date: 2/1/2020 Subject: Fluorescence spectroscopy.; X-ray spectroscopy.; X-rays — Diffraction.; Materials — Analysis. Collections: EBSCO Allowed Actions: –
Action 'Read' will be available if you login or access site from another network
Action 'Download' will be available if you login or access site from another network
Group: Anonymous Network: Internet |
Annotation
This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods.The book will be useful for specialists in the field of solid state physi.
Document access rights
| Network | User group | Action | ||||
|---|---|---|---|---|---|---|
| Finuniversity Local Network | All |
|
||||
| Internet | Readers |
|
||||
|
Internet | Anonymous |
Table of Contents
- Contents
- List of Legends
- Foreword
- Chapter 1
- Chapter 2
- Chapter 3
- Chapter 4
- Chapter 5
- References
Usage statistics
|
|
Access count: 0
Last 30 days: 0 Detailed usage statistics |