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Dinnebier, Robert E.,. Rietveld refinement: practical pattern analysis using TOPAS / Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans. — 1 online resource (xvi, 331 pages) — <URL:http://elib.fa.ru/ebsco/2018175.pdf>.

Record create date: 2/17/2019

Subject: Rietveld method.; X-rays — Diffraction.; Crystallography.; Crystallography.; Rietveld method.; X-rays — Diffraction.

Collections: EBSCO

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Table of Contents

  • Preface
  • Contents
  • 1. The powder diffraction method
  • 2. The Rietveld method
  • 3. Structure independent fitting
  • 4. Peak shapes: Instrument o microstructure
  • 5. Quantitative phase analysis
  • 6. Restraints, constraints and rigid bodies
  • 7. Solving crystal structures using the Rietveld method
  • 8. Symmetry mode refinements
  • 9. Magnetic refinements
  • 10. Stacking disorder
  • 11. Total scattering methods
  • 12. Multiple data sets
  • 13. Appendix: Mathematical basics
  • Index

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